CL-2400 Non-Contact Thickness Meter Based on a unique, capacitive measurement principle, the CL-2400 provides highly accurate non-contact thickness measurements on a wide array of materials.

Reliable Sensor Technology The CL-2400 employs Ono Sokki's proven VE-series high-precision, capacitive gap sensors.  These sensors are designed to measure the gap between the face of the sensor and the surface of the target material. Thickness is measured when the target material is placed within the gap formed between two opposing sensors. The simple sensor structure provides excellent durability and reliability.  And the non-contact measurement process does not affect the material under measurement.

Measurable Materials: Conductors & Semiconductors

Silicon Wafers Aluminum Sheets Hard Disk Drives Printed Circuit Boards Any conductive materials where a high      degree of cleanliness must be maintained. Soft materials, materials with a mirrored     finish, films, or other materials that are highly-susceptible to surface damage

Static or Running Thickness Measurements Thickness (and gap) measurements are captured by the CL-2400 every 20 milliseconds for the duration of a measurement period (from measurement START to STOP).  Maximum, minimum, and range for gap and thickness data are recorded during the measurement period. In addition, BCD output is provided and can be configured to output a moving average (from 1 to 64 samples) during each measurement period.  The optional RQ-1410 Printer with SPC functions can be connected to the CL-2400 for hardcopy results.

Optional Fixtures For Common Measurement Applications Ono Sokki. Offers several optional test fixtures for common measurement applications, including: Hard Disk Measurement Station Film Thickness Measurement Station Wafer Slide Tables (diameters from 100 to 300mm)

Measurement Automation BDC output, RS-232 computer interface, and remote control inputs are provided for external control, analysis, and measurement automation.